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A flexible film thickness measurement system that can combine from spectrometers to software and microscopes.
The film thickness measurement system proposed by OptoSilus is an original system that combines spectrometers, light sources, reflection probes, etc., from Ocean Optics with spectral interference film thickness measurement software from collaborating manufacturers.
Benchtop UV-compatible luminous flux measurement device
BaseSpion is a tabletop light distribution measurement device that is the perfect tool for any lab. All drivers, including power analyzers and goniometers, are built-in and extremely compact. Additionally, with an option, you can upgrade the BaseSpion to "BaseSpion UV-VIS," allowing you to measure part of the UV-C range, which has seen increasing demand in recent years. BaseSpion UV-VIS can measure 3D light distribution and color for both visible and UV light simultaneously. By understanding the light distribution characteristics of UV radiation, users can enhance the efficiency of UV disinfection and curing. For more details, please download the catalog or feel free to contact our representative.
A UV-compatible luminous flux measurement system that covers small lamps to large lamps.
VisoSystems' LabSpion is a photometric measurement system that covers a wide range of light sources, from small lamps and LED chips to large panels and streetlights. To meet the increasing demand for the UV-C range, it is capable of measuring from 200nm and above. With a 2-axis goniometer, it can measure the photometric distribution of a wide variety of light sources. It provides LDT and IES files for lighting design. Thanks to its unique technology, it enables light flux measurement using a spectral sensor and an integrated power analyzer, allowing for rapid measurement of all data. Additionally, LabSpion can be upgraded to "LabSensor UV-VIS" as an option. LabSensor UV-VIS can measure 3D photometric and color measurements of visible and UV light simultaneously. Users can enhance the efficiency of UV disinfection and curing by understanding the photometric characteristics of UV radiation. For more details, please download the catalog or contact us.
An inexpensive and simple film thickness measurement system using Ocean Optics spectrometers!
The SKOP (Starter Kit for Optical thickness measurement) optical film thickness measurement system measures the spectral reflectance of optical thin films and determines their thickness by analyzing the spectrum. The thin film on the substrate acts as an etalon, causing an interference pattern in the reflection spectrum. The spacing between the peaks of the sinusoidal pattern correlates with the refractive index of the material and the thickness of the film. In SKOP, the interference pattern is analyzed using dedicated software to convert it into the film thickness.
